Testing facility

We offer a comprehensive test facility with two Teradyne Z1890 ATE in circuit test machines, AOI automated optical inspection, J-Tag boundary scan, full functional board and instrument test together with calibration, QC and soak tailored to meet any specific requirement

At the heart of our test facility are two Teradyne Z1890VP in-circuit test machines. With a maximum node count of 2048, comprehensive analogue and digital device coverage and vectorless test techniques, we can obtain a very high level of fault coverage with a short test time.

We pride ourselves on offering low cost test tooling using our fixturing partners, FABMaster translation software and experienced programmers.
We also offer J-Tag test and a variety of functional test solutions using modern test equipment and highly trained, experienced test engineers.
Whatever your requirement we can develop a test solution to meet your needs.